2005 Summer Topical Meeting - Proceedings
July 20-22, 2005, Middletown, CT, The Inn at Middletown
Precision Interferometric Metrology

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Technical Sessions

Session I
Wednesday, July 20, 2005, 8:45 am - 10:00 am

  • Opening Remarks and Welcome
    W. T. Estler, C. J. Evans, P. de Groot
    Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer
  • Metrology for Space-based Science Missions (Invited Paper)
    Lay, O. P.; Dubovitsky, S.; Peters, R. D. (Jet Propulsion Laboratory)
    Precision Interferometric Metrology/Oral/Abstract/2005 Summer
  • Gravitational Wave Detection Using Precision Interferometry
    Harry, G. M. (Massachusetts Institute of Technology)
    Precision Interferometric Metrology/Oral/Abstract/2005 Summer

Session II
Wednesday, July 20, 2005, 10:30 am - 12:00 pm

Session III
Wednesday, July 20, 2005, 1:30 pm - 3:00 pm

  • Deflectometry Rivals Interferometry (Invited Paper)
    Häusler, G. (University of Erlangen)
    Precision Interferometric Metrology/Oral/Abstract/2005 Summer
  • Application of Phase Retrieval to Precision Optical Metrology
    Brady, G. R.; Fienup, J. R. (University of Rochester)
    Precision Interferometric Metrology/Oral/Abstract/2005 Summer
  • Reduction of Noise and Artifacts in Fizeau Interferometers
    Kuechel, M. (Zygo Corporation)
    Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer

Session IV
Gary Sommargren Retrospective
Wednesday, July 20, 2005, 3:30 pm - 5:00 pm

Gary Sommargren, recipient of ASPE’s 2003 Lifetime Achievement award, passed away in March 2005. This
session will contain presentations highlighting three major areas where Gary made major contributions to the practice of precision interferometry

  • The Heterodyne Profiler Redux
    Parise, P. R. (Convergent Technologies)
    Precision Interferometric Metrology/Oral/Abstract/2005 Summer
  • Displacement Measuring Interferometry
    Zanoni, C. A. (Zygo Corporation)
    Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer
  • The Point Diffraction Interferometer
    Evans, C. J. (Zygo Corporation)
    Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer

Session V
Thursday, July 21, 2005, 8:30 am - 10:00 am

Session VI
Thursday, July 21, 2005, 10:30 am - 12:00 pm

Open Forum
Thursday, July 21, 2005, 7:30 pm –

A tradition at ASPE’s Topical Meetings on interferometry is an evening session of free flowing discussion, short
reports of latest results, and provocative presentations on needs and technical directions in the field. Bring a couple of viewgraphs and come prepared to participate.

Session VII
Friday, July 22, 2005, 8:30 am - 10:00 am

Session VIII
Friday, July 22, 2005, 10:30 am - 12:00 pm

Session IX
Friday, July 22, 2005, 1:30 pm - 3:00 pm

  • Modeling of Optical Image Transformations by Means of 4x4 Matrices
    Meyer, P. J.; van Eijk, J. (Philips Applied Technologies)
    Precision Interferometric Metrology/Oral/Abstract/2005 Summer
  • Discussion: Open Issues, New Directions
    Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer
  • Closing Remarks
    Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer