2005 Summer Topical Meeting - Proceedings
July 20-22, 2005, Middletown, CT, The Inn at Middletown
Precision Interferometric Metrology

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Technical Sessions

Session I
Wednesday, July 20, 2005, 8:45 am - 10:00 am

• Opening Remarks and Welcome
  W. T. Estler, C. J. Evans, P. de Groot
  Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer
• Metrology for Space-based Science Missions (Invited Paper)
  Lay, O. P.; Dubovitsky, S.; Peters, R. D. (Jet Propulsion Laboratory)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Gravitational Wave Detection Using Precision Interferometry
  Harry, G. M. (Massachusetts Institute of Technology)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer

Session II
Wednesday, July 20, 2005, 10:30 am - 12:00 pm

• Displacement Laser Interferometry with Sub-nanometer Uncertainty
  Cosijns, S. J. A. G. (ASML Netherlands B.V.); Haitjema, H. (Mitutoyo Research Center Europe B.V.); and Schellekens, P. H. J. (Eindhoven University of Technology)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Real-time Periodic Error Correction: Experiment and Data Analysis
  Schmitz, T. L.; Houck III, L. (University of Florida); and Chu, D.; Kalem, L. (Agilent Technologies, Inc.)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Synchronous Acoustooptic Tuning of Free Space External Cavity Lasers for Homodyne Chirp Interferometry
  Owen, G.; Trutna, Jr., W. R. (Agilent Technologies)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer

Session III
Wednesday, July 20, 2005, 1:30 pm - 3:00 pm

• Deflectometry Rivals Interferometry (Invited Paper)
  Häusler, G. (University of Erlangen)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Application of Phase Retrieval to Precision Optical Metrology
  Brady, G. R.; Fienup, J. R. (University of Rochester)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Reduction of Noise and Artifacts in Fizeau Interferometers
  Kuechel, M. (Zygo Corporation)
  Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer

Session IV
Gary Sommargren Retrospective
Wednesday, July 20, 2005, 3:30 pm - 5:00 pm
Gary Sommargren, recipient of ASPE’s 2003 Lifetime Achievement award, passed away in March 2005. This
session will contain presentations highlighting three major areas where Gary made major contributions to the practice of precision interferometry

• The Heterodyne Profiler Redux
  Parise, P. R. (Convergent Technologies)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Displacement Measuring Interferometry
  Zanoni, C. A. (Zygo Corporation)
  Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer
• The Point Diffraction Interferometer
  Evans, C. J. (Zygo Corporation)
  Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer

Session V
Thursday, July 21, 2005, 8:30 am - 10:00 am

• Rapid, Accurate, and High-resolution Metrology of Aspheric Optics -- Can We “Have It All”? (Invited Paper)
  Forbes, G. W. (QED Technologies)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Minimizing Uncertainty in Cryogenic Surface Figure Measurement
  Blake, P. N.; Mink, R.; Chambers, V. J.; Content, D.; Davila, P. (NASA/Goddard Space Flight Center); and Robinson, F. D. (Orbital Sciences Corporation)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Enhancing Measurement Accuracy with Subaperture Stitching Interferometry
  Murphy, P. E.; DeVries, G.; O'Donohue, S. (QED Technologies, Inc.)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer

Session VI
Thursday, July 21, 2005, 10:30 am - 12:00 pm

• Customized Three-flat Calibration Method for a 320mm Aperture Fizeau Interferometer with Vertical Optical Axis
  Burke, J.; Oreb, B.; Netterfield, R. (CSIRO Industrial Physics)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Gaussian Beam Modeling of the Radius of Curvature
  Medicus, K. M.; Snyder, J. J.; Davies, A. D. (University of North Carolina at Charlotte)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Interferometric Measurement of Sphere Diameter
  Desiraju, K.; Hocken, R. J. (University of North Carolina at Charlotte)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer

Open Forum
Thursday, July 21, 2005, 7:30 pm –
A tradition at ASPE’s Topical Meetings on interferometry is an evening session of free flowing discussion, short
reports of latest results, and provocative presentations on needs and technical directions in the field. Bring a couple of viewgraphs and come prepared to participate.

Session VII
Friday, July 22, 2005, 8:30 am - 10:00 am

• Optoelectronic Digital Holographic Methodologies for Shape and Deformation Measurements (Invited Paper)
  Furlong-Vazquez, C. (Worcester Polytechnic Institute)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Sophisticated Light Switches
  Liesener, J.; Seifert, L.; Reicherter, M. (Universität Stuttgart)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Tomographic Methods to Characterize Three-dimensional Refractive Index Inhomogeneities
  Kauffmann, J.; Kerwien, N.; Tiziani, H. J.; Osten, W. (Universität Stuttgart)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer

Session VIII
Friday, July 22, 2005, 10:30 am - 12:00 pm

• Interferometric Metrology for Multi-beam Displacement Measuring Interferometer Assemblies
  Schroeder, M. J.; Selberg, L. A. (Zygo Corporation)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Super Oblique Incidence Interferometer Using SWS Prism
  Otani, Y. (University of Arizona); and Mizutani, Y.; Umeda, N. (Tokyo University of Agriculture and Technology)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Interferometric Thickness Calibration of 300mm Silicon Wafers
  Wang, Q.; Griesmann, U.; Polvani, R. (National Institute of Standards and Technology)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer

Session IX
Friday, July 22, 2005, 1:30 pm - 3:00 pm

• Modeling of Optical Image Transformations by Means of 4x4 Matrices
  Meyer, P. J.; van Eijk, J. (Philips Applied Technologies)
  Precision Interferometric Metrology/Oral/Abstract/2005 Summer
• Discussion: Open Issues, New Directions
  Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer
• Closing Remarks
  Precision Interferometric Metrology/Oral/Abstract Not Available/2005 Summer