Coordinate Measuring Machines

June 25 - 26, 2003
University of North Carolina at Charlotte, Charlotte, NC

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Wednesday, June 25, 8:45 a.m. –9:15 a.m.
Welcome, CPM Introduction
Robert J. Hocken (University of North Carolina at Charlotte)

Session I
Calibration / Performance Assessment
Wednesday, June 25, 9:15 a.m. – 12:15 p.m.

1. Using a CMM for Optical System Assembly and Alignment
   Parks, R. E.; Kuhn, W. P. (Optical Perspectives Group, LLC)
   Calibration and Performancee Assessment/Oral/Abstract/2003 Summer
2. Proposed New Tests for Evaluating CMM Performance
   Pereira, P. H.; Beutel, D. E. (Caterpillar, Inc.)
   Calibration and Performancee Assessment/Oral/Abstract/2003 Summer
3. New Concept Geostep
   Gleason Jr., E. A. (Ball Tech)
   Calibration and Performancee Assessment/Oral/Abstract/2003 Summer
4. Six Degree of Freedom Precision Measurement System
   Cui, H.; Pan, Z.; Zhu, Z. (Stevens Institute of Technology)
   Calibration and Performancee Assessment/Oral/Abstract/2003 Summer

Session II
Software / Algorithms
Wednesday, June 25, 1:15 p.m. – 2:35 p.m.

1. Evaluation of CMM Tolerance Calculation Software
   Thomas, P. D. (Mitutoyo America Corporation)
   Software and Algorithms/Oral/Abstract/2003 Summer
2. An Improved B-spline Approach for the Surfaces Reconstruction from Data Measured by CMM
   Caliò, F.; Miglio, E.; Moroni, G.; Rasella, M. (Politecnico di Milano)
   Software and Algorithms/Oral/Abstract/2003 Summer

Session III
CMM Design
Wednesday, June 25, 2:35 p.m. – 5:30 p.m.

1. A Novel Ultra Precision CMM Based on Fundamental Design Principles
   Ruijl, T. A. M. (Philips Centre for Industrial Technology); and van Eijk, J. (Delft University of Technology)
   CMM Design/Oral/Abstract/2003 Summer
2. Design of a 3D-Coordinate Measuring Machine for Measuring Small Products in Array
   van Seggelen, J. K.; Rosielle, P. C. J. N.; Schellekens, P. H. J. (Eindhoven University of Technology); and Spaan, H. A. M. (IBS Precision Engineering bv); and Bergmans, R. H. (NMi Van Swinden Laboratorium)
   CMM Design/Oral/Abstract/2003 Summer
3. A Modular, Multiple Sensor Embedded System CMM Motion Controller
   Chang, D. W.; Wu, P.; Harris, J. O.; Spence, A. D. (McMaster University); and Peterson, J. E.; Heslip, J. (Omni-Tech Corporation)
   CMM Design/Oral/Abstract/2003 Summer
4. Russ Shelton: Father of the CMM (Invited Paper)
   Devitt, A. J. (New Way Precision)
   CMM Design/Oral/Abstract/2003 Summer

Session IV
Uncertainty Issues
Thursday, June 26, 8:30 a.m. – 10:30 a.m.

1. The Validation of CMM Task Specific Measurement Uncertainty Software
   Phillips, S. D.; Borchardt, B. R.; Abackerly, A. J.; Shakarji, C.; Sawyer, D. (National Institute of Standards and Technology); Murray, P.; Rasnick, W. H. (BWXT Y-12, LLC); and Summerhays, K. D.; Baldwin, J. M.;
   Henke, R. P.; Henke, M. P. (MetroSage, LLC)
   Uncertainty Issues/Oral/Abstract/2003 Summer
2. Manufacturing Signatures and CMM Sampling Strategies
   Moroni, G.; Rasella, M. (Politecnico di Milano); and Polini, W. (Università di Cassino)
   Uncertainty Issues/Oral/Abstract/2003 Summer
3. Calibrating and Testing CMMs in a World of Uncertainty and Accreditation
   Salsbury, J. G. (Mitutoyo America Corporation)
   Uncertainty Issues/Oral/Abstract/2003 Summer

Session V
Probe Design
Thursday, June 26, 10:50 a.m. – 1:50 p.m.

1. Novel 3D Analogue Probe With a Small Sphere and Low Measurement Force
   Meli, F.; Bieri, M.; Thalmann, R. (Swiss Federal Office of Metrology, METAS); Fracheboud, M.; Breguet, J.-M.; Clavel, R. (Institut de Production et Robotique, EPFL); and Bottinelli, S. (MECARTEX, Z.I.)
   Probe Design/Oral/Abstract/2003 Summer
2. A Study for Development of Small-CMM Probe Detecting Contact Angle
   Ogura, I.; Okazaki, Y. (National Institute of Advanced Industrial Science & Technology)
   Probe Design/Oral/Abstract/2003 Summer
3. A Trinocular Vision Probe for Sculptured Surface Measurements
   Zhang, G. X.; Zhang, H. W.; Liu, Z.; Guo, J. B.; Zhao, X. S.; Fan, Y. M.; Qiu, Z. R.; Li, X. F.; Li, Z. (Tianjin University)
   Probe Design/Oral/Abstract/2003 Summer

Session VI
Applications
Thursday, June 26, 1:50 p.m. – 3:10 p.m.

1. Non-contact Shape Measurements of Ultra-lightweight X-ray Optics
   Hadjimichael, T.; Fleetwood, C. (Swales Aerospace); and Content, D.; Waluschka, E.; Wright, G. (NASA Goddard Space Flight Center)
   Applications/Oral/Abstract/2003 Summer
2. High Accuracy CMM Measurements of Large Silicon Spheres
   Stoup, J. R.; Doiron, T. D. (National Institute of Standards and Technology)
   Applications/Oral/Abstract/2003 Summer