Advances in Surface Metrology

June 2-5, 1997
St. John's College
Annapolis, Maryland

PDF versions of the abstracts of the 1997 Spring Topical Meeting Proceedings are not available. Contact ASPE to purchase a copy of the Proceedings. ASPE does not sell individual copies of abstracts.

Session I
Sensor Technology
Tuesday, June 3, 8:30 a.m. - 10:00 a.m.

1. Opening Remarks
   Stuart T. Smith and Jay Raja (UNC-Charlotte)
   Surface Metrology - Sensor Technology/Oral/No Abstract Available/1997 Spring
2. X-ray Surface Metrology
   D. K. Bowen (Bede Scientific Inc.)
   Surface Metrology - Sensor Technology/Oral/No Abstract Available/1997 Spring
3. Surface Characterization Using a Resonator Based Profilometer (Invited Paper)
   S. M. Harb (Coventry University) and S. T. Smith (UNC-Charlotte)
   Surface Metrology - Sensor Technology/Oral/Abstract/1997 Spring
4. US TAG for ISO TC213 Issues and Developments of Standards
   Surface Metrology - Sensor Technology/Oral/No Abstract Available/1997 Spring

Session II
Signal Processing I
Tuesday, June 3, 10:30 a.m. - 12:00 p.m.

1. Filtering of Surface Profiles, Past, Present and Future
   X. Liu and J. Raja (UNC-Charlotte)
   Surface Metrology - Signal Processing/Oral/Abstract/1997 Spring
2. Estimation of Arithmetic Mean Wavelength for the Areal Topographic Data
   K. Yanagi, Y. Kobayashi and S. Hara (Nagaoka University of Technology)
   Surface Metrology - Signal Processing/Oral/Abstract/1997 Spring
3. Evaluation of Functional Features of Orthopaedic Joint Prostheses Surfaces Using Wavelets
   X. Q. Jiang, L. Blunt and K. J. Stout (University of Birmingham)
   Surface Metrology - Signal Processing/Oral/Abstract/1997 Spring
4. A New Reference Line to Surface Roughness Evaluation
   Q. Chen, X. Q. Jiang, S. Yang and Z. Li (Huazhong University of Science & Technology)
   Surface Metrology - Signal Processing/Oral/Abstract/1997 Spring

Session III
Signal Processing II
Tuesday, June 3, 1:30 p.m. - 3:30 p.m.

1. An Investigation of Filtering of 3D Surface Texture Measurements Using Scale-sensitive Fractal Analysis and PSD
   D. K. Cohen (Michigan Metrology) and C. A. Brown, W. A. Johnsen, P. Hoch (Worcester Polytechnic Institute)
   Surface Metrology - Signal Processing/Oral/Abstract/1997 Spring
2. A Fractal-based Comparison of Surface Profiling Instrumentation
   M. Malburg (Cummins Engine Company, Inc.)
   Surface Metrology - Signal Processing/Oral/Abstract/1997 Spring
3. A New Comprehensive Measuring and Analyzing System for Form and Surface Topography
   Xiao, S., Jiang, X. Q., Xie, T. and Li, Z. (Huazhong University of Science & Technology)
   Surface Metrology - Signal Processing/Oral/Abstract/1997 Spring
4. Study on Polishing Mechanism of Magnetic Disc Substrate
   S. M. Liu, G. Q. Cai (Northeastern University) and X. L. Feng (HEN LAN Electronic Equipment, Inc.)
   Surface Metrology - Signal Processing/Oral/Abstract/1997 Spring

Session IV
Novel Measuring Instruments
Wednesday, June 4, 8:30 a.m. - 10:00 a.m.

1. Phase Grating Interferometer Gauge
   D. Mansfield and I. K. Buehring (Taylor Hobson, Ltd.)
   Surface Metrology - Novel Measuring Instruments/Oral/Abstract/1997 Spring
2. Wide-field Scanning White Light Interferometry of Rough Surfaces
   J. Roth and P. de Groot (Zygo Corporation)
   Surface Metrology - Novel Measuring Instruments/Oral/Abstract/1997 Spring
3. Expanded Area Interferometric Surface Profiling with High Spatial Resolution
   P. J. Caber, J. C. Wyant and J. Schmit (WYKO Corporation)
   Surface Metrology - Novel Measuring Instruments/Oral/Abstract/1997 Spring
4. Rapid Data Acquisition and Analysis for Part Profiling
   R. Jennings (ICAMP, Inc.)
   Surface Metrology - Novel Measuring Instruments/Oral/Abstract/1997 Spring
5. A Novel Metrological Low Force Probe
   V. Badami (UNC-Charlotte)
   Surface Metrology - Novel Measuring Instruments/Oral/No Abstract Available/1997 Spring

Session V
Calibration and Standards
Wednesday, June 4, 10:30 a.m. - 12:00 p.m.

1. Calibration Problems in Surface Metrology
   T. V. Vorburger, R. G. Dixson, J. F. Song, T. B. Renegar, J. Fu (NIST), V. W. Tsai (University of Maryland) and T. Doi (National Research Laboratory of Metrology)
   Surface Metrology - Calibration and Standards/Oral/Abstract/1997 Spring
2. Measurements of Pitch, Height, and Width Artifacts with the NIST Calibrated Atomic Force Microscope
   R. G. Dixson, T. V. Vorburger, J. Fu, R. Koning (NIST) and V. W. Tsai, E. D. Williams, X. S. Wang (University of Maryland)
   Surface Metrology - Calibration and Standards/Oral/Abstract/1997 Spring
3. Accurate Force Measurements for Miniature Mechanical Systems: A Review of Progress
   L. P. Howard (NIST)
   Surface Metrology - Calibration and Standards/Oral/No Abstract Available/1997 Spring

Session VI
Interesting Applications
Thursday, June 5, 8:30 a.m. - 10:00 a.m.

1. AFM/IFM Nanometer Scale Mechanical Property Measurements
   K. Jaraush and P. Russell (N. C. State University)
   Surface Metrology - Applications/Oral/No Abstract Available/1997 Spring
2. Atomic Force Microscopy for Profiler Stylus Quality Control
   H. H. Gatzen, J. C. Maetzig and H. Siekmann (Hanover University)
   Surface Metrology - Applications/Oral/Abstract/1997 Spring
3. Atomic Force Microscope Applications in Surface Metrology
   C. Mooney (Park Scientific Instruments)
   Surface Metrology - Applications/Oral/No Abstract Available/1997 Spring
4. Instrument for On-line Monitoring of Surface Roughness of Machined Surfaces
   J. G. Valliant (Optical Dimensions) and J. M. Bennett (Consultant)
   Surface Metrology - Applications/Oral/Abstract/1997 Spring