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ASPE Meetings
 26th ASPE Annual Meeting

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Dear Colleague:

Momentum is building for our Annual Meeting in Denver, CO. Mark your calendar so you do not miss this event on November 13th to 18th.

Over 140 papers and posters have been accepted. And additional poster papers are welcome until August 1. Technical sessions include:

Interferometry and Optics

Precision Manufacturing

Multi-Axis Machine Design

Precision Metrology

Nano-Positioning

Precision Machining Processes

Control of Precision Machines

Precision Component Design

Click here for a list of oral papers to be presented.

Up to 25 tutorials will be presented. Topics include metrology, flexures, materials, MEMS, mechatronics, principles of precision engineering design, thermal effects on precision machines and others. This is an excellent opportunity to increase or refresh your knowledge of the practical application of precision engineering. Watch our website for more details as the conference approaches.

Equally exciting are the commercial exhibits and commercial sessions. Exhibit space is filling rapidly with new and returning exhibitors displaying new products and services. Click here to learn how to exhibit at ASPE.

Denver is a beautiful city on the front range of the Rocky Mountains. The Denver Annual Meeting offers you an opportunity to learn, grow professionally, expand your network, and enjoy a time to rejuvenate in the many recreational activities within and near the city.

I look forward to hearing from you and seeing you at an ASPE meeting in 2011.

Tom Dow, Executive Director

PATTERN #5: METROLOGY FRAME*

Real materials are elastic; therefore self-induced structural deformations are inevitable. As targeted performance improves, these self-induced deformations eventually result in errors that limit performance. This is true for both metrology systems and machine tools. A solution to this problem is the “metrology frame”.

The metrology frame is a separate structure isolated from the structural deformation error source. The deforming structure uses the stable metrology structure as a reference thereby improving the metrology system or machine tool performance.

PATTERN #5: Assess the influences of varying loads on the instrument base due to different work pieces and instrument motions. If necessary use an independent reference frame for measurement and make the metrology frame as small as possible to minimize environmental influences.

Next pattern: MATERIALS SELECTION

*Based on "Patterns for Precision Instrument Design", a classic ASPE tutorial by C. Teague, C. Evans and later D. Swyt. It uniquely identifies 12 foundational mechanical concepts or patterns driving precision in fabrication, assembly and metrology.


The American Society for Precision Engineering promotes the future of manufacturing in America by advancing precision engineering; though supporting education; and encouraging the development and application of precision principles.

ASPE, founded in 1986, is a non-profit organization.

Click here to learn more about ASPE.