Sunday, October 4, 2009
Morning |
Sunday, October 4, 2009
Afternoon |
Control/Design
Interactions in Precision Machines - Part 1: Modeling
Pradeep Subrahmanyan, RAPT Industries, Inc. |
Control/Design
Interactions in Precision Machines - Part 2: Synthesis
Pradeep Subrahmanyan, RAPT Industries, Inc. |
This tutorial has been
cancelled.
Electromechanics
and Electromagnetic Levitation in Precision Applications - Part
1
Funda Sahin, Philips Applied Technologies
Georgo Angelis, Philips Applied Technologies
|
This tutorial has been cancelled.
Electromechanics
and Electromagnetic Levitation in Precision Applications - Part
2
Funda Sahin, Philips Applied Technologies
Georgo Angelis, Philips Applied Technologies
|
Interferometric
Form Metrology for Precision Machined Surfaces
Vivek Badami, Zygo Corp. |
Surface Metrology
Christopher Brown, Worcester Polytechnic Institute |
Spectral Shifting
- a Signal to Noise Enhancer
Daniel DeBra, Stanford University
Brian Lantz, Stanford University |
Machine Tool Metrology
Robert Hocken, UNC - Charlotte |
Design,
Fabrication and Implementation of Kinematic Coupling Technology
Martin Culpepper, MIT |
Fine Motion Mechanisms
Anthony E. Gee, University College – London |
Monday, October 5, 2009
Morning |
Monday, October 5, 2009
Afternoon |
Mechatronics and
Dynamic Error Budgeting - Part 1
Jan van Eijk, MICE bv
David Trumper, MIT |
Mechatronics and
Dynamic Error Budgeting - Part 2
Jan van Eijk, MICE bv
David Trumper, MIT |
Flexures,
Compliant Instruments and Multi-Axis Compliant Positioning Stages-Part
1
Martin Culpepper, MIT
Shorya Awtar, University of Michigan |
Flexures,
Compliant Instruments and Multi-Axis Compliant Positioning Stages-Part
2
Martin Culpepper, MIT
Shorya Awtar, University of Michigan |
Manufacturing Processes
for Molded Optics
E. Brinksmeier, University of Bremen
K. Rickens, University of Bremen |
Axis of Rotation
Metrology
Eric Marsh, Penn State University |
Fundamentals
of Transducers and Instrumentation for the Precision Engineer
Anthony E. Gee, University College - London |
This tutorial has been cancelled.
Focused
Ion Beam (FIB) Systems and Applications
Phillip E. Russell, Appalachian
State University
|
Measurement Uncertainty:
Concepts and Applications
W. Tyler Estler and Steven D. Philips, NIST |
Thermal Effects
in Precision Engineering Systems
Dan E. Luttrell, Moore Tool Company |
Precision
Engineering from an Optician's Viewpoint
Robert Parks, Optical Perspectives Group, LLC |
Precision
Engineering Principles
Layton Hale, Innovative Machine Solutions |