2008 Annual Meeting Oral Presentations

2008 Oral Presentations

Table of Contents

Machine Design I * Novel Systems * State of the Art Precision and Ultra-Precision Machining * euspen Session * Machining * Sensors and Controls * Metrology * Interferometry * Machine Design II

Session I
Machine Design I
Tuesday, October 21, 2008, 8:30 am - 10:00 am
Session Chair: Keith Carlisle (Lawrence Livermore National Laboratory) and Hans-Jochen Trost (MicroFab Technologies, Inc.)

Robotic System for Precision Assembly of NIF Ignition Targets
Montesanti, R. C.; Seugling, R. M.; Klingmann, J. L.; Dzenitis, E. G.; Miller, G. L.; Kent, R. A.; Castro,C.; Reynolds, J. L. (Lawrence Livermore National Laboratory); and Alger, E. T. (General Atomics)
Rotary-Axial Spindles for Precision Manufacturing
Lu, X.; Paone, M.; Usman, I. (The University of British Columbia); Slocum, A. H. (Massachusetts Institute of Technology); and Yui, A. (The National Defense Academy)
Design and Test Of A 2-D Precision Weak-Link Stage System with Sub-Centimeter Travel Range and Sub-Nanometer Resolution
Shu, D.; Maser, J. (Argonne National Laboratory
Design, Realization and Testing of the NANOMEFOS Non-contact Measurement Machine for Freeform Optics
Henselmans, R.; Rosielle, P. C. J. N.; Steinbuch, M. (Eindhoven University of Technology); and Cacace, L. (AC Optomechanix)

Session II
Novel Systems
Tuesday, October 21, 2008, 10:30 am - 12:00 pm
Session Chair: Pradeep K. Subrahmanyan (RAPT Industries, Inc.) and Mark Kosmowski
(Electro Scientific Industries, Inc.)

Invited Paper -- To be Announced (Invited Paper)
TBA
Precision Material Removal Using the Electrokinetic Phenomenon
Leo, C. S.; Yang, C.; Butler, D. L. (Nanyang Technological University); Danyluk, S.; Blackburn, T. L. (Georgia Institute of Technology); and Ng, S. H. (Singapore Institute of Manufacturing Technology)
Open Loop Fast Tool Servo with Nanometer Accuracy for Diamond Machining of Diffractive Structures
Gläbe, R.; Lünemann, B.; Brinksmeier, E. (Bremen University); and Falldorf, C.; Dankwart, C.; von Kopylow, C. (Bremer Institut für Angewandte Strahltechnik)
Pneumatic Servo Bearing Actuator for Ultraprecise Positioning: Part 1
Hirayama, T.; Kitagawa, T.; Kadotani, M.; Danjyo, H.; Matsuoka, T. (Doshisha University); Sasaki, K. (Pneumatic Servo Controls, Ltd.); and Yabe, H. (Osaka Electro-Communication University)
Grinding of Microstructured Functional Surfaces – A Novel Strategy for Dressing of Microprofiles on Vitrified Grinding Wheels
Denkena, B.; Boehnke, D.; Wang, B. (Leibniz Universität Hannover)

Session III
State of the Art Precision and Ultra-Precision Machining
Wednesday, October 22, 2008, 8:30 am - 10:00 am
Session Chair: Session Chairs to be Announced

Cutting
Takeuchi, Y. (Osaka University)
Grinding and Polishing
Kuriyagawa, T. (Tohoku University)
Electric Discharge Machining
Kunieda, M. (Tokyo University of Agriculture & Technology)
Micro Factory
Mishima, N. (Advanced Manufacturing Research Institute (AIST))

Session IV
euspen Session
Wednesday, October 22, 2008, 10:30 am - 12:00 pm
Session Chair: Session Chairs to be Announced

Overview of Precision Technology in Europe
Van Brussel, H. (Katholieke Universiteit Leuven)
Advancements in Displacement Metrology Based on Encoder Systems
Holzapfel, W. (Dr. Johannes Heidenhain GmbH)
Precision Machining of Space Telescope Mirrors
Shore, P. (Cranfield University Precision Engineering Centre)
Advanced Precision for Lithograhy Systems
Loopstra, E. R. (ASM Lithography B.V.)

Session V
Machining
Wednesday, October 22, 2008, 1:30 pm - 3:00 pm
Session Chair: David D. Gill (Sandia National Laboratories) and Allen Y. Yi (The Ohio
State University)

The Milling Dynamics “Super Diagram”: Combining Stability and Surface Location Error
Schmitz, T. L.; Zapata Ramos, R. E. (University of Florida)
Sub-Surface Damage Issues For Effective Grinding Of Large Optics
Tonnellier, X.; Shore, P.; Morantz, P.; Orton, D. (Cranfield University Precision Engineering Centre); and Yu, G. (University College London)
Ultrasonic Assisted Diamond Turning of Hardened Steel with Monocrystalline Diamond
Klocke, F.; Dambon, O.; Bulla, B. (Fraunhofer Institute for Production Technology – IPT)
Diamond Micro Chiseling of Molding Inserts for Optical Microstructures
Flucke, C.; Gläbe, R.; Brinksmeier, E. (Bremen University)
Machining Behaviour of Monocrystalline Diamond End Mills
Oberschmidt, D.; Uhlmann, E. (Fraunhofer IPK)

Session VI
Sensors and Controls
Wednesday, October 22, 2008, 5:30 pm - 6:30 pm
Session Chair: Jeffrey W. Roblee (AMETEK-Precitech, Inc.) and Steven Williams (QED Technologies, International)

Control of a Fast, Long Range Actuator
Chen, Q.; Dow, T. A.; Garrard, K. P.; Sohn, A. (North Carolina State University)
Precision-limit Positioning Using Higher Order Sliding Mode Control
Hsieh, C.; Yang, C.-C. (National Cheng Kung University)
High Accuracy Atomic Force Microscope for Dimensional Metrology
Ljubicic, D. M.; Trumper, D. L. (Massachusetts Institute of Technology); and Hocken, R. J.; Overcash, J. L. (University of North Carolina at Charlotte)
Determining Radial and Tilt Errors of a Non-Orthogonal Rotary Axis
McGlauflin, M. L. (National Institute of Standards and Technology)

Session VII
Metrology
Thursday, October 23, 2008, 8:30 am - 10:30 am
Session Chair: Byron R. Knapp (Olympic Precision, Inc.) and Henny A. M. Spaan (ISB Precision Engineering BV)

Comparison of the NIST and NPL Low Force Balances Using Microgram Mass Standards
Jones, C. W.; Leach, R. K. (National Physical Laboratory); and Kramar, J. A.; Pratt, J. R. (National Institute of Standards and Technology)
Investigating Scaling Limits of a Fiber Based Resonant Probe for Metrology Applications
Seugling, R. M.; Darnell, I.; Florando, J. (Lawrence Livermore National Labs); Woody, S. C.; Bauza, M. B. (InsituTec, Inc.); and Smith, S. T. (University of North Carolina at Charlotte)
A Comparison of Optical Sensing Methods for the High Precision 3D Surface Profile Measurement of Grooved Surfaces
McBride, J. W.; Zhao, Z.; Boltryk, P. (University of Southampton)
Design and Fabrication of a Multifunctional Scanning Probe with Integrated Tip Changer for Fully Automated Nanofabrication
Taylor, C.; Leang, K. (Virginia Commonwealth University)
Two-dimensional Displacement Measurement Using the Six-point Atomic Encoder Technique
Chaikool, P.; Aketagawa, M. (Nagaoka University of Technology); and Okuyama, E.(Akita University)

Session VIII
Interferometry
Thursday, October 23, 2008, 10:30 am - 12:00 pm
Session Chair: Robert D. Grejda (Corning Tropel Corporation) and Byron R. Knapp (Olympic Precision, Inc.)

A New Heterodyne Interferometer with Zero Periodic Error and Tunable Beat Frequency
Kim, H. S.; Schmitz, T. L. (University of Florida)
Uncertainty Considerations for Interferometric Stability Testing
Ellis, J. D.; Spronck, J. W.; Munnig Schmidt, R.-H. (Delft University of Technology)
Measurement of the Absolute Distance Between Two Reflective Surfaces
Badami, V. G.; Deck, L. L.; Selberg, L. A. (Zygo Corporation)
Measuring Machines with Interferometrical Stylus for Form Measurement of Precise Mechanical Parts
Drabarek, P.; Gnausch, T.; Fleischer, M. (Robert Bosch GmbH)
Absolute Length (Thickness) Measurements Using Wavelength Scanning Interferometry
Suratkar, A. R.; Davies, A. D.; Farahi, F. (University of North Carolina at Charlotte)

Session IX
Machine Design II
Thursday, October 23, 2008, 1:30 pm - 3:00 pm
Session Chair: Deming Shu (Argonne National Laboratory) and Mark A. Stocker (Cranfield Precision)

Parallel-Kinematics MEMS Stages for High Precision Nanopositioning and Manipulation
Dong, J.; Mukhopadhyay, D.; Pengwang, E.; Ferreira, P. M. (University of Illinois Urbana-Champaign)
Novel Split Stage Architecture
Kosmowski, M. T. (Electro Scientific Industries, Inc. (ESI))
Fixturing Optical Flats with Minimal Distortion and Error-Motions
Shilpiekandula, V.; Youcef-Toumi, K. (Massachusetts Institute of Technology)
(Short Abstract Not Available by the Request by Author)
Simulation and Prediction of theThermally Induced Deformations on Machine Tools Caused by Moving Linear Axis Using the FDEM Simulation Approach
Mayr, J.; Ess, M.; Weikert, S.; Wegener, K. (Swiss Federal Institute of Technology (ETHZ)
Component Placement Robot with Wireless Energy and Data Transfer
Jansen, G. G. L. M.; Sahin, F. (Philips Applied Technologies)

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