| Abstract
ID |
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2011 |
| Title |
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Development and Analysis of an Optical Capability for the Measurement of Arrays |
| Category |
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Metrology: Form & Geometry |
| Primary
author |
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| Organization |
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| Content |
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The Mesoscale Manufacturing and Systems Development Department at Sandia National Laboratories has developed a unique capability to measure optical arrays in response to customers’ needs. A specific need was to measure an array of miniature spherical optics where the optical surface was only a very small spherical surface patch. Previous attempts to use a coordinate measuring machine proved to have too much error due to the very small portion of the spherical surface available for measurement. In response, a small form-measuring interferometer was mounted in a 4-axis diamond turning machine. This combination allowed the high accuracy positioning of the diamond turning machine to be utilized with the capabilities of the interferometer, and has proven to be a very versatile tool. In addition to the measurement of optical arrays, the system allows rapid measurement of diamond turned surfaces for tool centering, tool radius error compensation, feature positioning, and part radius of curvature measurements.
The authors have developed and uncertainty analysis for the interferometer/DTM system and the system is comparable to an LVDT probing capability provided by the DTM manufacturer. The presentation will include the details of the uncertainty analysis, the results of the LVDT comparison, and examples of the ways in which the system has been utilized.
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