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2006 |
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Design of a Robot-based Detector Manipulator for a Hard X-ray Nanoprobe Instrument System |
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Equipment, Machines & Instruments: Novel Systems |
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| Content |
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A hard x-ray nanoprobe beamline is being developed at the Advanced Photon Source (APS). The beamline will house a hard x-ray nanoprobe instrument, one of the centerpieces of the characterization facilities of the Center for Nanoscale Materials (CNM) being constructed at Argonne National Laboratory (ANL). The instrument will combine a scanning probe mode with a full-field transmission mode. It uses x-ray fluorescence for trace-element mapping and spectroscopy; x-ray diffraction to obtain local structural information such as crystallographic phase, strain texture, and x-ray transmission in phase; and absorption to image internal structures of complex devices [1].
The high-precision positioning mechanisms for the nanoprobe presented here consist of the following major component groups: a granite base with vibration isolators, an optomechanical instrument vacuum chamber, a robotic detector manipulator for microdiffraction, an in situ optical microscope, and a translation-stage system for a transmission imaging detector [2]. This paper presents the design of a robot-based detector manipulator for microdiffraction applications with the hard x-ray nanoprobe instrument system.
References:
1. J. Maser, G. B. Stephenson, D. Shu, B. Lai, S. Vogt, A. Khounsary, Y. Li, C. Benson, G. Schneider, SRI 2003, AIP Conf. Proc. 705, (2004) 470-473.
2. D. Shu, J. Maser, B. Lai, and S. Vogt, SRI 2003, AIP Conf. Proc. 705, (2004) 1287-1290.
* Work supported by the U.S. Department of Energy under contract No. W-31-109-ENG-38.
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